In the semiconductor and photovoltaic manufacturing fields, silicon wafer cleaning is a critical process step. Ozone is widely used in cleaning processes due to its strong oxidizing properties to remove organic contamination. However, the ozone off-gas released during wafer cleaning produces a strong, irritating odor that not only affects operator health but also may cause potential corrosion to cleanroom equipment. Through practice and data analysis, using manganese dioxide or copper‑manganese composite oxide catalysts to decompose ozone under ambient conditions is currently the most effective, safe, and economical purification solution. This method achieves ozone decomposition efficiency above 99%, outlet ozone concentration below 0.1 ppm, no secondary pollution, simple operation, and low operating cost, making it the preferred choice for ozone abatement in silicon wafer cleaning workshops.
In silicon wafer cleaning processes, ozone mainly originates from two types of processes: ozone water cleaning and ultraviolet ozone cleaning. Ozone water cleaning (O₃+H₂O) introduces ozone into deionized water to form ozone water, which cleans photoresist residues and organic contaminants from the wafer surface. The ozone dissolved in water continuously escapes during circulation, transport, and drainage, especially near the cleaning bath opening and drain port, where ozone concentrations are relatively high, creating noticeable odors.
Ultraviolet ozone cleaning (UVO) uses 185 nm UV light to photolyze oxygen (O₂) in air, generating highly reactive atomic oxygen, which further forms ozone. The ozone reacts with organic matter inside the chamber, oxidizing it to CO₂ and H₂O, completing the cleaning. However, after cleaning, residual ozone in the chamber is released into the workshop with the exhaust air, causing odors. Overall, ozone acts both as a green oxidizer in the cleaning process and as a source of odor and potential hazards.
Ozone has strong oxidizing and irritating properties, posing potential risks to both human health and equipment. In silicon wafer cleaning workshops, operators may face the following hazards:
It is worth noting that although ozone can naturally decompose into oxygen at ambient temperature, the closed environment of semiconductor cleanrooms makes it difficult for ozone to dissipate naturally, so active abatement measures must be taken.
For ozone issues in silicon wafer cleaning workshops, the industry has developed several abatement technologies. Each method has different characteristics, advantages, and disadvantages:
| Method | Principle | Advantages | Disadvantages |
|---|---|---|---|
| Activated Carbon Adsorption | Uses porous activated carbon to physically adsorb ozone and promote its decomposition | Low cost, simple operation | Limited adsorption capacity, efficiency drops at high humidity, requires frequent replacement or regeneration |
| Thermal Decomposition | Heats ozone‑containing gas to 300–400°C to accelerate decomposition to oxygen | High decomposition efficiency, suitable for high ozone concentrations | High energy consumption, high operating cost, requires specialized heating equipment |
| Electromagnetic Wave Radiation Decomposition | Uses UV or near‑infrared light to irradiate ozone, causing its decomposition to oxygen | Flexible adjustment of treatment concentration | High energy consumption, low light utilization efficiency, unstable for low‑concentration ozone treatment |
| Chemical Scrubbing | Uses a scrubbing solution such as sodium thiosulfate to absorb ozone | Good absorption efficiency | Produces waste liquid requiring additional treatment, not suitable for electronics cleanrooms |
| Catalytic Decomposition | Uses copper‑manganese composite oxide catalysts to lower activation energy, decomposing O₃ to O₂ at ambient temperature | High efficiency, zero energy consumption, long life, no secondary pollution | May require pre‑treatment under high‑humidity conditions |
Catalytic decomposition is currently the mainstream solution for ozone abatement in silicon wafer cleaning workshops, with advantages as follows:
Copper‑manganese composite oxide catalysts rapidly decompose ozone under ambient temperature and pressure. Mature products achieve decomposition efficiencies of 95%–99.9%, with outlet ozone concentrations as low as below 0.1 ppm, fully meeting occupational safety standards.
The catalytic decomposition process requires no heating or chemical consumption; the only energy input is for fan power to move the air. Long‑term operating costs are much lower than those of thermal decomposition or chemical scrubbing.
Catalyst life can reach 3–5 years, reducing equipment downtime and maintenance costs.
The catalyst maintains high activity across a relative humidity range of 0%–98% and can treat large‑volume, low‑concentration ozone exhaust with excellent stability.
Catalytic decomposition completely converts ozone to oxygen, generating no waste liquid or toxic byproducts, and presents no risk of flammable materials, fully complying with the stringent air quality requirements of semiconductor cleanrooms.
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